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XRF Metrology

  • XRF Metrology - copy
  • XRF Metrology - copy
XRF Metrology - copyXRF Metrology - copy

XRF Metrology - copy

  • Composition and thickness analysis
  • Material selection, layer formulations
  • In-line and off-line process control
  • Yield management

Application:

  • Metal film stack composition such as CIGS
  • Photovoltaic manufacturing process
  • Micro-electronic manufacturing
  • Corrosion resistance coating
  • Thermal barrier coating
  • Energy (CIGS, CIS, batteries)

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