XRF Metrology

• Offers an array of choices for X-ray optics and primary filters
• Equipped with latest generation of Silicon Drift Detectors
• Provides empirical and fundamental parameters (FP) solutions in a simple to set up calibration process
• Large analysis chamber
• X-Y-Z programmable positioning

Specialized application areas:

• Photovoltaic manufacturing
• Protective metallic coatings
• Wafer level metallization and micro-electronics
• Corrosion/wear and thermal barrier analysis