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Second-hand Machines

  • KLA TENCOR Surface Profiler
  • KLA TENCOR Surface Profiler
  • KLA TENCOR Surface Profiler
  • KLA TENCOR Surface Profiler
  • KLA TENCOR Surface Profiler
KLA TENCOR Surface ProfilerKLA TENCOR Surface ProfilerKLA TENCOR Surface ProfilerKLA TENCOR Surface ProfilerKLA TENCOR Surface Profiler

KLA TENCOR Surface Profiler

  • KLA TENCOR
  • Surface Profiler
  • used
  • KLA
  • Product description: KLA Surface Profiler, P-17, Surface Profiler, KLA TENCOR, Used KLA TENCOR, Used KLA, Used P-17,TLA Tencor® P-17
  • INQUIRY

Our company has recently acquired a batch of second-hand TLA Tencor® P-17 Surface Profilers. These machines are in excellent condition, with a condition rating of 8-9 out of 10, and they are in good working order. We offer competitive pricing and provide comprehensive after-sales service. Please feel free to inquire about our offerings!

Product Description
The Tencor P-17 is a desktop, probe-based surface profiler and represents over 40 years of surface measurement expertise. This industry-leading system supports two-dimensional (2D) and three-dimensional (3D) measurements of step height, roughness, warp, and stress with a scanning range of up to 200mm without the need for stitching.

Outstanding measurement stability is achieved through the combination of UltraLite® sensors, constant force control, and a super-flat scanning stage. Setting up programs is made quick and easy with features like click-stage control, top-down and side-view optical elements, and a high-resolution camera with optical zoom capabilities. The Tencor P-17 probe-based surface profiler supports both 2D and 3D measurements and offers various filtering, leveling, and analysis algorithms for surface profiling. Full automation is achieved through pattern recognition, sequencing, and feature detection.

Features:
- Step height: Nanometers to 1000 micrometers
- Constant force control: 0.03 to 15mg
- Full-diameter scanning without stitching
- Video: 5MP high-resolution color camera
- Arc correction: Corrects errors caused by probe arc motion
- Software: User-friendly software interface
- Production capability: Fully automated measurements with sequencing, pattern recognition, and SECS/GEM capabilities

Applications:
- Step height: 2D and 3D step heights
- Texture: 2D and 3D roughness and waviness
- Shape: 2D and 3D warp shapes
- Stress: 2D and 3D thin film stress
- Defect detection: 2D and 3D defect surface profiling

Industries:
- Industrial manufacturing
- Universities, laboratories, and research institutions
- Semiconductor and compound semiconductor
- LED (Light Emitting Diode)
- Solar energy
- MEMS (Micro-Electro-Mechanical Systems)
- Data storage
- Automotive
- Medical devices